Analysts’ Recent Ratings Changes for Camtek (CAMT)
by Kim Johansen · The Markets DailySeveral analysts have recently updated their ratings and price targets for Camtek (NASDAQ: CAMT):
- 12/16/2025 – Camtek had its “neutral” rating reaffirmed by analysts at Cantor Fitzgerald. They now have a $120.00 price target on the stock.
- 12/15/2025 – Camtek had its “hold (c+)” rating reaffirmed by analysts at Weiss Ratings.
- 12/15/2025 – Camtek had its price target raised by analysts at Jefferies Financial Group Inc. from $130.00 to $140.00. They now have a “buy” rating on the stock.
- 12/15/2025 – Camtek is now covered by analysts at The Goldman Sachs Group, Inc.. They set a “neutral” rating and a $123.00 price target on the stock.
- 12/15/2025 – Camtek is now covered by analysts at The Goldman Sachs Group, Inc.. They set a “hold” rating and a $123.00 price target on the stock.
- 12/9/2025 – Camtek had its “hold (c+)” rating reaffirmed by analysts at Weiss Ratings.
- 12/1/2025 – Camtek is now covered by analysts at Morgan Stanley. They set an “equal weight” rating and a $110.00 price target on the stock.
- 11/11/2025 – Camtek had its price target raised by analysts at Barclays PLC from $85.00 to $120.00. They now have an “overweight” rating on the stock.
- 11/11/2025 – Camtek had its price target raised by analysts at Evercore ISI from $100.00 to $130.00. They now have an “outperform” rating on the stock.
Camtek Ltd. (NASDAQ: CAMT) is a provider of automated inspection and metrology solutions for the semiconductor and printed circuit board (PCB) industries. The company develops, manufactures and markets a suite of inline and stand-alone systems that perform high‐resolution 2D and 3D measurements, defect review and process control. Its products are used by integrated device manufacturers, foundries, OSAT (outsourced semiconductor assembly and test) providers, and PCB fabricators to optimize yield, improve product quality and reduce production costs.
Camtek’s core offerings include wafer inspection systems that detect and classify defects on patterned wafers, patterned wafer metrology tools for overlay and critical dimension measurements, and advanced packaging inspection platforms for 3D ICs and fan-out wafer-level packaging.